The Euromicro Conference on Digital System Design (DSD) addresses all aspects of (embedded, pervasive and high-performance) digital and mixed HW/SW system engineering, covering the whole design trajectory from system specification down to micro-architectures, digital circuits and VLSI implementations.
Modern embedded appliances already integrate a multitude of functionalities with potentially different criticality levels into a single system and this trend is expected to grow in the near future. The integration of multiple functions with different criticality and certification assurance levels on a shared computing platform constitutes a mixed-criticality system (MCS). Mixed-criticality systems range from lowest assurance requirements up to the highest criticality levels. In many domains such as automotive, avionics and industrial control, the economic success depends on the ability to design, implement, qualify and certify advanced real-time embedded systems within bounded time, effort and costs. Without appropriate preconditions, the integration of mixed-criticality subsystems can lead to a significant and potentially unacceptable increase of engineering and certification costs.
Topics of interest include, but are not limited to, the following:
Kim Grüttner (OFFIS, DE) – chair
Eugenio Villar (U Cantabria, ES) – co-chair
Mikel Azkarate-askatsua (IK4-IKERLAN, ES)
Sanjoy Baruah (U North Carolina, USA)
Gedare Bloom (George Washington U, USA)
Francisco J. Cazorla (BSC & IIIA-CSIC, ES)
Alfons Crespo (UPV & FentISS, ES)
William Fornaciari (Politecnico di Milano, IT)
Kees Goossens (TU/e, NL)
Kim Grüttner (OFFIS, DE)
Philipp A. Hartmann (Intel, DE)
Xabier Iturbe (ARM. GB)
Renato Mancuso (Boston University, USA)
Silvia Mazzini (INTECS, IT)
Julio Medina (U Cantabria, ES)
Roman Obermaisser (U Siegen, DE)
Michael Paulitsch (Intel, DE)
Ingo Sander (KTH, SE)
Andreas von Schwerin (Siemens, DE)
Ingo Stierand (OFFIS, DE)
Jean-Loup Terraillon (ESA, NL)
Sascha Uhrig (Airbus, DE)
Heechul Yun(University of Kansas, USA)